We have determined the surface plasmon excitation correction (SEC) factor for nickel in the 200-5000 eV range from the ratios of the absolute elastic scattering electron intensities measured by a novel cylindrical mirror analyzer and those by the Monte Carlo method. The inelastic mean free paths (IMFPs) of nickel used for the Monte Carlo method in the energy range specified were calculated by the Penn algorithm. The resulting SECs were smaller than the values calculated from Chen and Oswald general equations of surface excitation parameters (SEPs), which describe the influence of surface plasmon excitations by electrons crossing a solid surface. We also found that SEPs (obtained from SECs) could be fitted to the equation Ps(α, E) = C/[En cos(α)+C] or Ps(α, E) = aE-b/cos(α) (<7% root-mean-square error) in the 200-5000 eV energy range, where Ps is the SEP, α is the surface crossing angle of the electron to the surface normal, n(= 0.41), C(= 5.39), a(= 1.7) and b(= 0.29) are parameters and E is the electron energy.
|ジャーナル||Surface and Interface Analysis|
|出版ステータス||Published - 2000 8月 1|
|イベント||8th European Conference on Applications of Surface and Interface Analisys, ECASIA 99 - Sevilla, Spain|
継続期間: 1999 10月 4 → 1999 10月 8
ASJC Scopus subject areas
- 化学 (全般)