Evaluation Criterion for Determining Turn-to-Turn Contact Electrical Resistance Satisfying High Thermal Stability and Shortening Charging Delay in NI-REBCO Coils for MRIs

Yuka Yoshihara*, Mai Hamanaka, Kyoka Tsuyoshi, Mayu Kitamura, Ui Nemoto, So Noguchi, Atsushi Ishiyama

*この研究の対応する著者

研究成果: Article査読

2 被引用数 (Scopus)

抄録

We have been developing a no-insulation (NI) coil technology to achieve high thermal stability and high current density. NI coils can continue to operate even if a part of the coils degrades; however, a charging delay occurs in the coils. Moreover, the turn-to-turn contact electrical resistance of the NI coils must be increased to shorten the charging delay; however, a large turn-to-turn contact electrical resistance reduces thermal stability. In this study, using turn-to-turn contact electrical resistance and IOP/IC ratios as parameters, we analyze thermal stability and consider the possibility that NI coils can continue to operate even if they have local defects. Furthermore, to establish an evaluation criterion for determining turn-to-turn contact electrical resistance that can shorten charging delay and ensure high thermal stability, we analyze and evaluate the relationship between turn-to-turn contact electrical resistance and thermal stability, focusing on three types of heat generation.

本文言語English
論文番号9381674
ジャーナルIEEE Transactions on Applied Superconductivity
31
5
DOI
出版ステータスPublished - 2021 8月

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • 電子工学および電気工学

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