Evaluation of de-embedding technique accuracy depending on de-embedding patterns for CMOS circuits up to 110 GHz

Naoko Ono*, Kyoya Takano, Mizuki Motoyoshi, Kosuke Katayama, Minoru Fujishima

*この研究の対応する著者

研究成果: Conference contribution

抄録

The accuracy of de-embedding techniques depending on de-embedding layout patterns has been verified by experiment up to 110 GHz for CMOS circuits. The accuracy of the measured characteristics is affected significantly by the de-embedding procedure, which has been done for the raw measurement data. The de-embedding patterns and some transmission lines (TL) as test device were designed and fabricated using 40 nm CMOS process. From the experiment results, it was confirmed that each characteristic of the TL, such as propagation constant and characteristic impedance, has a different suitable de-embedding pattern to set a reference plane at a different desired position.

本文言語English
ホスト出版物のタイトルEuropean Microwave Week 2012
ホスト出版物のサブタイトル"Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012
ページ548-551
ページ数4
出版ステータスPublished - 2012 12 1
外部発表はい
イベント7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012 - Amsterdam, Netherlands
継続期間: 2012 10 292012 10 30

出版物シリーズ

名前European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012

Other

Other7th European Microwave Integrated Circuits Conference, EuMIC 2012 - Held as Part of 15th European Microwave Week, EuMW 2012
国/地域Netherlands
CityAmsterdam
Period12/10/2912/10/30

ASJC Scopus subject areas

  • ハードウェアとアーキテクチャ

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