Evaluation of temperature and germanium concentration dependence of EXAFS oscillations in Si-rich silicon germanium thin films
K. Yoshioka*, R. Yokogawa, M. Koharada, H. Takeuchi, G. Ogasawara, I. Hirosawa, T. Watanabe, A. Ogura
*この研究の対応する著者
研究成果: Conference contribution