Excitonic recombination radiation as characterization of diamonds using cathodoluminescence

H. Kawarada, A. Yamaguchi

研究成果: Article査読

11 被引用数 (Scopus)

抄録

Free-exciton and bound-exciton recombination radiation has been investigated for the characterization of crystal quality and dopants in natural high pressure synthetic and chemically vapour-deposited diamonds using cathodoluminescence. In the limited areas where the growth conditions are optimized, distinct emissions of free-exciton recombination have been observed even in polycrystalline diamond or in crystals formed in nitrogen-rich conditions. The emission is useful for local estimation of crystal purity. Bound-exciton recombination radiation reflects the acceptor concentration in homoepitaxial boron-doped films. The emissions are dominant in the range 1.8-5.5 eV.

本文言語English
ページ(範囲)100-105
ページ数6
ジャーナルDiamond and Related Materials
2
2-4
DOI
出版ステータスPublished - 1993 3 31

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 化学 (全般)
  • 機械工学
  • 物理学および天文学(全般)
  • 材料化学
  • 電子工学および電気工学

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