The concentration profiles of thin-film Pt/bulk Ni coatings annealed at 1150, 1250 and 1300 °C for different time were measured by means of electron probe microanalysis. The corresponding interdiffusion coefficients were then determined using the thin-film solution. The calculated concentration profiles based on the presently obtained interdiffusion coefficients agree well with the experimental ones, but better at a higher temperature or a longer time. The comparison between the presently measured concentration profiles and the DICTRA simulated ones indicates that it is promising to apply the well-established atomic mobility databases due to bulk diffusion information in coating systems with some simple modifications for diffusivities.
|ジャーナル||Journal of Mining and Metallurgy, Section B: Metallurgy|
|出版ステータス||Published - 2010|
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