Fast scanning tunneling microscope for dynamic observation

Sumio Hosaka, Tsuyoshi Hasegawa, Shigeyuki Hosoki, Keiji Takata

研究成果: Article

11 引用 (Scopus)

抜粋

A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.

元の言語English
ページ(範囲)1342-1343
ページ数2
ジャーナルReview of Scientific Instruments
61
発行部数4
DOI
出版物ステータスPublished - 1990 12 1

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ASJC Scopus subject areas

  • Instrumentation

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