抄録
A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.
本文言語 | English |
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ページ(範囲) | 1342-1343 |
ページ数 | 2 |
ジャーナル | Review of Scientific Instruments |
巻 | 61 |
号 | 4 |
DOI | |
出版ステータス | Published - 1990 |
外部発表 | はい |
ASJC Scopus subject areas
- 器械工学