Fast scanning tunneling microscope for dynamic observation

Sumio Hosaka; Tsuyoshi Hasegawa; Shigeyuki Hosoki; Keiji Takata

doi:10.1063/1.1141189

Fast scanning tunneling microscope for dynamic observation

Sumio Hosaka, Tsuyoshi Hasegawa, Shigeyuki Hosoki, Keiji Takata

先進理工学部

研究成果: Article

11 引用（Scopus）

抜粋

A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.

元の言語	English
ページ（範囲）	1342-1343
ページ数	2
ジャーナル	Review of Scientific Instruments
巻	61
発行部数	4
DOI	https://doi.org/10.1063/1.1141189
出版物ステータス	Published - 1990 12 1

フィンガープリント

ASJC Scopus subject areas

Instrumentation

これを引用

Hosaka, S., Hasegawa, T., Hosoki, S., & Takata, K. (1990). Fast scanning tunneling microscope for dynamic observation. Review of Scientific Instruments, 61(4), 1342-1343. https://doi.org/10.1063/1.1141189

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文献にアクセス

10.1063/1.1141189