抄録
A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 1342-1343 |
| ページ数 | 2 |
| ジャーナル | Review of Scientific Instruments |
| 巻 | 61 |
| 号 | 4 |
| DOI | |
| 出版ステータス | Published - 1990 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 器械工学