The depth-profile measurement of particle ions is a time- and labor-consuming task, and thus an efficient method is desired. To solve this problem, we propose a new method to measure depth profiles and test it for carbon ions. In our method, we use a thin silver-activated zinc sulfide (ZnS(Ag)) scintillator plate set against the inner top side of a black box and irradiate a uniform carbon-ion beam to this plate from the upper side. On the ZnS(Ag) plate, a wedge-shaped acrylic block is set to absorb the carbon ions depending on the plate’s position. The scintillation light’s image is reflected by a surface mirror set below the ZnS(Ag) plate and then detected by a cooled charge-coupled device (CCD) camera from the side. We irradiate carbon ions for 6 s and measure the ZnS(Ag) image that is partially attenuated by the wedge-shaped acrylic block. By setting the profile on the measured image, we could estimate the depth profile of the carbon-ion beam, although a quenching of the scintillator is observed around the Bragg peak area. We conclude that our proposed method is promising for efficiently measuring the depth profile of particle ions.
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