Fidelity of near-field intensity distribution of surface plasmon on slightly rough surfaces

Tetsuya Kawanishi*

*この研究の対応する著者

研究成果: Article査読

抄録

Near-fields of electromagnetic waves scattered by slightly rough metal surfaces which support the surface plasmon mode at optical frequencies were studied theoretically by using the stochastic functional approach. Fidelity of near-field intensity images, defined by the correlation coefficient between the surface profile and the intensity of the scattered wave field, was investigated in order to discuss field distributions of the surface plasmon on complicated structures. We show that the fidelity strongly depends on the incident wavenumber and polarization when the incident wave corresponds to the surface plasmon mode.

本文言語English
ページ(範囲)2065-2070
ページ数6
ジャーナルIEICE Transactions on Electronics
E85-C
12 SPEC.
出版ステータスPublished - 2002 12月
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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