抄録
Near-fields of electromagnetic waves scattered by slightly rough metal surfaces which support the surface plasmon mode at optical frequencies were studied theoretically by using the stochastic functional approach. Fidelity of near-field intensity images, defined by the correlation coefficient between the surface profile and the intensity of the scattered wave field, was investigated in order to discuss field distributions of the surface plasmon on complicated structures. We show that the fidelity strongly depends on the incident wavenumber and polarization when the incident wave corresponds to the surface plasmon mode.
本文言語 | English |
---|---|
ページ(範囲) | 2065-2070 |
ページ数 | 6 |
ジャーナル | IEICE Transactions on Electronics |
巻 | E85-C |
号 | 12 SPEC. |
出版ステータス | Published - 2002 12月 |
外部発表 | はい |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 電子工学および電気工学