Field electron emission under extreme high vacuum and extreme high vacuum technology of Korea

Boklar Cho, S. Chung, Chuhei Oshima

研究成果: Article

抜粋

An extreme high vacuum field emission microscope (XHV-FEM) was constructed for the study of inherent fluctuations of field emission (FE) current. The damping and fluctuation behaviors of FE from clean W(111) tips at 90 K were observed using the XHVFEM. The noise of FE currents ranging from 10 pA to 100 μA was measured under ∼7 × 10-10 Pa. Stepwise features were routinely observed in damping curves of the FE current, indicating remarkable sensitivity of the FE current measuring system. The lowest frequency measurement of shot noise was recorded even at 4 Hz. Semilogarithmic damping curves of FE currents were linear in our thoroughly degassed XHV-FE system. The slope of semilogarithmic damping curves was linearly proportional to the operation pressure, suggesting a method of measuring pressure in an XHV range. An introduction to the XHV technology of Korea is also presented.

元の言語English
ページ(範囲)635-641
ページ数7
ジャーナルJournal of the Vacuum Society of Japan
51
発行部数10
出版物ステータスPublished - 2008

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films

フィンガープリント Field electron emission under extreme high vacuum and extreme high vacuum technology of Korea' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用