Fine surface images that reflect cytoskeletal structures in cultured glial cells by atomic force microscopy

Yukako Yamane, Dai Hatakeyama, Takuro Tojima, Kazushige Kawabata, Tatsuo Ushiki, Shigeaki Ogura, Kazuhiro Abe, Etsuro Ito

研究成果: Article

14 引用 (Scopus)

抄録

The morphology of cultured glial cells was examined using a combination of atomic force microscopy (AFM) and immunofluorescence staining for cytoskeletons. The meshwork of type-1 astrocytes consisted of thick longitudinal and thin lateral lines on the cell surfaces observed by AFM; the former lines were confirmed to be reflections of actin filaments. The astrocytic processes of type-2 astrocytes were observed to be rugged on AFM. These structures were mainly affected by microtubules. Immunofluorescence imaging of microglia revealed that actin filaments and microtubules were arranged radially and wavily along the cell edge, respectively. AFM could detect these radial and wavy structures clearly. These results show that AFM can provide information on the cytoskeletons of glial cells, indicating that AFM is a useful tool for the morphological characterization of cells.

元の言語English
ページ(範囲)3849-3854
ページ数6
ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
37
発行部数6 SUPPL. B
出版物ステータスPublished - 1998 6
外部発表Yes

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cultured cells
Atomic force microscopy
atomic force microscopy
filaments
cells
staining
Neuroglia
Imaging techniques

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Engineering(all)

これを引用

Fine surface images that reflect cytoskeletal structures in cultured glial cells by atomic force microscopy. / Yamane, Yukako; Hatakeyama, Dai; Tojima, Takuro; Kawabata, Kazushige; Ushiki, Tatsuo; Ogura, Shigeaki; Abe, Kazuhiro; Ito, Etsuro.

:: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 巻 37, 番号 6 SUPPL. B, 06.1998, p. 3849-3854.

研究成果: Article

Yamane, Yukako ; Hatakeyama, Dai ; Tojima, Takuro ; Kawabata, Kazushige ; Ushiki, Tatsuo ; Ogura, Shigeaki ; Abe, Kazuhiro ; Ito, Etsuro. / Fine surface images that reflect cytoskeletal structures in cultured glial cells by atomic force microscopy. :: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 1998 ; 巻 37, 番号 6 SUPPL. B. pp. 3849-3854.
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AU - Yamane, Yukako

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AU - Kawabata, Kazushige

AU - Ushiki, Tatsuo

AU - Ogura, Shigeaki

AU - Abe, Kazuhiro

AU - Ito, Etsuro

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