Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism

Atsushi Yajima; Wataru Kobayashi; T. Ichimura; B. Cho; C. Oshima

doi:10.1109/IVMC.2003.1223006

Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism

Atsushi Yajima, Wataru Kobayashi, T. Ichimura, B. Cho^*, C. Oshima

^*この研究の対応する著者

研究成果: Conference contribution

本文言語	English
ホスト出版物のタイトル	Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003
出版社	Institute of Electrical and Electronics Engineers Inc.
ページ	107-108
ページ数	2
巻	2003-January
ISBN（電子版）	4818195154, 9784818195158
DOI	https://doi.org/10.1109/IVMC.2003.1223006
出版ステータス	Published - 2003
イベント	16th International Vacuum Microelectronics Conference, IVMC 2003 - Toyonaka, Osaka, Japan 継続期間: 2003 7月 7 → 2003 7月 11

Other

Other	16th International Vacuum Microelectronics Conference, IVMC 2003
国/地域	Japan
City	Toyonaka, Osaka
Period	03/7/7 → 03/7/11

ASJC Scopus subject areas

電子工学および電気工学
凝縮系物理学
電子材料、光学材料、および磁性材料

文献へのアクセス

10.1109/IVMC.2003.1223006

他のファイルとリンク

引用スタイル

Yajima, A., Kobayashi, W., Ichimura, T., Cho, B., & Oshima, C. (2003). Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism. In Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003 (Vol. 2003-January, pp. 107-108). [1223006] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVMC.2003.1223006

Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism. / Yajima, Atsushi; Kobayashi, Wataru; Ichimura, T. その他.

Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003. Vol. 2003-January Institute of Electrical and Electronics Engineers Inc., 2003. p. 107-108 1223006.

研究成果: Conference contribution

Yajima, A, Kobayashi, W, Ichimura, T, Cho, B & Oshima, C 2003, Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism. in Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003. vol. 2003-January, 1223006, Institute of Electrical and Electronics Engineers Inc., pp. 107-108, 16th International Vacuum Microelectronics Conference, IVMC 2003, Toyonaka, Osaka, Japan, 03/7/7. https://doi.org/10.1109/IVMC.2003.1223006

Yajima A, Kobayashi W, Ichimura T, Cho B, Oshima C. Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism. In Technical Digest of the 16th International Vacuum Microelectronics Conference, IVMC 2003. Vol. 2003-January. Institute of Electrical and Electronics Engineers Inc. 2003. p. 107-108. 1223006 doi: 10.1109/IVMC.2003.1223006

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