First undersea-qualified 980 nm pump laser diode module evaluated with massive life test

M. Usami*, N. Edagawa, Yuichi Matsushima, H. Horie, T. Fujimori, I. Sakamoto, H. Gotoh

*この研究の対応する著者

研究成果: Chapter

2 被引用数 (Scopus)

抄録

Large scale long-term life test results of 980 nm pump laser diode modules are presented. No sudden failure has occurred in the aging test exceeding 7,000 hrs., and so a failure rate of 26.4FIT was obtained for the random failure mode. As for the wear-out mode, the cumulative failure rate after 27 years at 10 °C is expected to be 0.01%. The module reliability was as low as 1FIT. The obtained overall failure rate was 27.7FIT, which is sufficient for practical use in submarine cable systems.

本文言語English
ホスト出版物のタイトルConference on Optical Fiber Communication, Technical Digest Series
Place of PublicationPiscataway, NJ, United States
出版社IEEE
出版ステータスPublished - 1999
外部発表はい

ASJC Scopus subject areas

  • コンピュータ サイエンス(全般)
  • 工学(全般)

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