Large scale long-term life test results of 980 nm pump laser diode modules are presented. No sudden failure has occurred in the aging test exceeding 7,000 hrs., and so a failure rate of 26.4FIT was obtained for the random failure mode. As for the wear-out mode, the cumulative failure rate after 27 years at 10 °C is expected to be 0.01%. The module reliability was as low as 1FIT. The obtained overall failure rate was 27.7FIT, which is sufficient for practical use in submarine cable systems.
|ホスト出版物のタイトル||Conference on Optical Fiber Communication, Technical Digest Series|
|出版場所||Piscataway, NJ, United States|
|出版物ステータス||Published - 1999|
ASJC Scopus subject areas
- Computer Science(all)