First undersea-qualified 980 nm pump laser diode module evaluated with massive life test

M. Usami, N. Edagawa, Yuichi Matsushima, H. Horie, T. Fujimori, I. Sakamoto, H. Gotoh

研究成果: Chapter

1 引用 (Scopus)

抜粋

Large scale long-term life test results of 980 nm pump laser diode modules are presented. No sudden failure has occurred in the aging test exceeding 7,000 hrs., and so a failure rate of 26.4FIT was obtained for the random failure mode. As for the wear-out mode, the cumulative failure rate after 27 years at 10 °C is expected to be 0.01%. The module reliability was as low as 1FIT. The obtained overall failure rate was 27.7FIT, which is sufficient for practical use in submarine cable systems.

元の言語English
ホスト出版物のタイトルConference on Optical Fiber Communication, Technical Digest Series
出版場所Piscataway, NJ, United States
出版者IEEE
出版物ステータスPublished - 1999
外部発表Yes

ASJC Scopus subject areas

  • Computer Science(all)
  • Engineering(all)

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  • これを引用

    Usami, M., Edagawa, N., Matsushima, Y., Horie, H., Fujimori, T., Sakamoto, I., & Gotoh, H. (1999). First undersea-qualified 980 nm pump laser diode module evaluated with massive life test. : Conference on Optical Fiber Communication, Technical Digest Series IEEE.