Future lunar mission Active X-ray Spectrometer development: Surface roughness and geometry studies

Masayuki Naito, Nobuyuki Hasebe, H. Kusano, H. Nagaoka, M. Kuwako, Y. Oyama, E. Shibamura, Yoshiharu Amano, Tohru Ohta, K. J. Kim, J. A M Lopes

    研究成果: Article

    3 引用 (Scopus)

    抜粋

    The Active X-ray Spectrometer (AXS) is considered as one of the scientific payload candidates for a future Japanese mission, SELENE-2. The AXS consists of pyroelectric X-ray generators and a Silicon Drift Detector to conduct X-Ray Fluorescence spectroscopy (XRF) on the Moon to measure major elements: Mg, Al, Si, Ca, Ti, and Fe; minor elements: Na, K, P, S, Cr and Mn; and the trace element Ni depending on their concentration. Some factors such as roughness, grain size and porosity of sample, and the geometry of X-ray incidence, emission and energy will affect the XRF measurements precision. Basic studies on the XRF are required to develop the AXS. In this study, fused samples were used to make homogeneous samples free from the effect of grain size and porosity. Experimental and numerical studies on the XRF were conducted to evaluate the effects from incidence and emission angles and surface roughness. Angle geometry and surface roughness will be optimized for the design of the AXS on future missions from the results of the experiment and the numerical simulation.

    元の言語English
    ページ(範囲)182-187
    ページ数6
    ジャーナルNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
    788
    DOI
    出版物ステータスPublished - 2015 7 11

    ASJC Scopus subject areas

    • Instrumentation
    • Nuclear and High Energy Physics

    フィンガープリント Future lunar mission Active X-ray Spectrometer development: Surface roughness and geometry studies' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用