GECOM: Test data compression combined with all unknown response masking

研究成果: Conference contribution

5 引用 (Scopus)

抜粋

This paper introduces GECOM technology, a novel test compression method with seamless integration of test GEneration, test COmpression (i.e. integrated compression on scan stimulus and masking bits) and all unknown scan responses Masking for manufacturing test cost reduction. Unlike most of prior methods, the proposed method considers the unknown responses during ATPG procedure and selectively encodes the specified 1 or 0 bits (either 1s or 0s) in scan slices for compression while at the same time masks the unknown responses before sending them to the response compactor. The proposed GECOM technology consists of GECOM architecture and GECOM ATPG technique. In the GECOM architecture, for a circuit with N internal scan chains, only c tester channels, where c = [log2 N] +2, are required. GECOM ATPG generates test patterns for the GECOM architecture thus not only the scan inputs could be efficiently compressed but also all the unknown responses would be masked. Experimental results on both benchmark circuits and real industrial designs indicated the effectiveness of the proposed GECOM technique.

元の言語English
ホスト出版物のタイトル2008 Asia and South Pacific Design Automation Conference, ASP-DAC
ページ577-582
ページ数6
DOI
出版物ステータスPublished - 2008 8 21
イベント2008 Asia and South Pacific Design Automation Conference, ASP-DAC - Seoul, Korea, Republic of
継続期間: 2008 3 212008 3 24

出版物シリーズ

名前Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

Conference2008 Asia and South Pacific Design Automation Conference, ASP-DAC
Korea, Republic of
Seoul
期間08/3/2108/3/24

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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  • これを引用

    Shi, Y., Togawa, N., Yanagisawa, M., & Ohtsuki, T. (2008). GECOM: Test data compression combined with all unknown response masking. : 2008 Asia and South Pacific Design Automation Conference, ASP-DAC (pp. 577-582). [4484018] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2008.4484018