GECOM: Test data compression combined with all unknown response masking

Youhua Shi*, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

*この研究の対応する著者

研究成果: Conference contribution

5 被引用数 (Scopus)

抄録

This paper introduces GECOM technology, a novel test compression method with seamless integration of test GEneration, test COmpression (i.e. integrated compression on scan stimulus and masking bits) and all unknown scan responses Masking for manufacturing test cost reduction. Unlike most of prior methods, the proposed method considers the unknown responses during ATPG procedure and selectively encodes the specified 1 or 0 bits (either 1s or 0s) in scan slices for compression while at the same time masks the unknown responses before sending them to the response compactor. The proposed GECOM technology consists of GECOM architecture and GECOM ATPG technique. In the GECOM architecture, for a circuit with N internal scan chains, only c tester channels, where c = [log2 N] +2, are required. GECOM ATPG generates test patterns for the GECOM architecture thus not only the scan inputs could be efficiently compressed but also all the unknown responses would be masked. Experimental results on both benchmark circuits and real industrial designs indicated the effectiveness of the proposed GECOM technique.

本文言語English
ホスト出版物のタイトル2008 Asia and South Pacific Design Automation Conference, ASP-DAC
ページ577-582
ページ数6
DOI
出版ステータスPublished - 2008 8月 21
イベント2008 Asia and South Pacific Design Automation Conference, ASP-DAC - Seoul, Korea, Republic of
継続期間: 2008 3月 212008 3月 24

出版物シリーズ

名前Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

Conference2008 Asia and South Pacific Design Automation Conference, ASP-DAC
国/地域Korea, Republic of
CitySeoul
Period08/3/2108/3/24

ASJC Scopus subject areas

  • コンピュータ サイエンスの応用
  • コンピュータ グラフィックスおよびコンピュータ支援設計
  • 電子工学および電気工学

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