Hardness estimation of chromium electrodeposits by an x-ray diffraction method

M. Inagaki; S. Ueda

doi:10.1016/0376-4583(76)90046-7

Hardness estimation of chromium electrodeposits by an x-ray diffraction method

M. Inagaki, S. Ueda

情報生産システム研究センター

研究成果: Article

抜粋

The relationship between Vickers microhardness and the half-value breadth of an X-ray diffraction line from electrodeposited chromium coatings was studied. The half-value breadth B was related to the hardness Hv by the equation Hv = 115B + 325. The hardness of thin coatings, which could not be determined by the use of a microhardness tester, was estimated by this equation.

元の言語	English
ページ（範囲）	521-526
ページ数	6
ジャーナル	Surface Technology
巻	4
発行部数	6
DOI	https://doi.org/10.1016/0376-4583(76)90046-7
出版物ステータス	Published - 1976

フィンガープリント

ASJC Scopus subject areas

Engineering(all)

これを引用

Inagaki, M., & Ueda, S. (1976). Hardness estimation of chromium electrodeposits by an x-ray diffraction method. Surface Technology, 4(6), 521-526. https://doi.org/10.1016/0376-4583(76)90046-7

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abstract = "The relationship between Vickers microhardness and the half-value breadth of an X-ray diffraction line from electrodeposited chromium coatings was studied. The half-value breadth B was related to the hardness Hv by the equation Hv = 115B + 325. The hardness of thin coatings, which could not be determined by the use of a microhardness tester, was estimated by this equation.",

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文献にアクセス

10.1016/0376-4583(76)90046-7