抄録
In this paper, we report on the significantly improved common-emitter I-V characteristics of GaN/InGaN DHBT with this regrown p-InGaN base layer.
本文言語 | English |
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ホスト出版物のタイトル | Device Research Conference - Conference Digest, DRC |
出版社 | Institute of Electrical and Electronics Engineers Inc. |
ページ | 23-24 |
ページ数 | 2 |
巻 | 2003-January |
ISBN(印刷版) | 0780377273 |
DOI | |
出版ステータス | Published - 2003 |
外部発表 | はい |
イベント | 61st Device Research Conference, DRC 2003 - Salt Lake City, United States 継続期間: 2003 6月 23 → 2003 6月 25 |
Other
Other | 61st Device Research Conference, DRC 2003 |
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国/地域 | United States |
City | Salt Lake City |
Period | 03/6/23 → 03/6/25 |
ASJC Scopus subject areas
- 電子工学および電気工学