High-resolution CdTe detector and applications to imaging devices

Tadayuki Takahashi*, Shin Watanabe, Manabu Kouda, Goro Sato, Yuu Okada, Shin Kubo, Yoshikatsu Kuroda, Mitsunobu Onishi, Ryoichi Ohno

*この研究の対応する著者

研究成果: Article査読

101 被引用数 (Scopus)

抄録

Using a high quality Cadmium Telluride (CdTe) wafer, we formed a Schottky junction and operated the detector as a diode (CdTe diode). The low leakage current of the CdTe diode allows us to apply a much higher bias voltage than was possible with the previous CdTe detectors. For a relatively thin detector of ∼ 0.5 mm thick, the high bias voltage results in a high electric field in the device. Both the improved charge collection efficiency and the low-leakage current lead to an energy resolution of 1.1 keV FWHM at 60 keV for a 2 × 2 mm2 device and 2 keV for a 10 × 10 mm2 device at 5 °C without any charge-loss correction electronics. For astrophysical applications, we have developed an initial prototype CdTe pixel detector based on the CdTe diode. The detector has 400 pixels with a pixel size of 625 × 625 μm2. Each pixel is gold-stud bonded to a fanout board and routed to a front end ASIC to measure pulse height information for each γ-ray photon.

本文言語English
ページ(範囲)287-291
ページ数5
ジャーナルIEEE Transactions on Nuclear Science
48
3 I
DOI
出版ステータスPublished - 2001 6月

ASJC Scopus subject areas

  • 電子工学および電気工学
  • 原子力エネルギーおよび原子力工学

フィンガープリント

「High-resolution CdTe detector and applications to imaging devices」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル