High-throughput von Neumann post-processing for random number generator

Ruilin Zhang, Sijia Chen, Chao Wan, Hirofumi Shinohara

研究成果

7 被引用数 (Scopus)

抄録

This paper presents the improvement and implementation of N bits Von Neumann (VN-N) post-processing technique, which is used to produce unbiased random bits sequence from biased one. Algorithm to realize general N bits VN-N and circuit level implementation of 4 bits VN-4 are shown. VN-4 achieved 40.6% output rate. A waiting strategy is further proposed to improve the output rate. VN-4+waiting and VN-8+waiting reached to 46.9% and 62.5% output rate, respectively. They are 1.88× and 2.50× improvements compared with original Von Neumann (VN-2) with 25.0%, respectively.

本文言語English
ホスト出版物のタイトル2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018
出版社Institute of Electrical and Electronics Engineers Inc.
ページ1-4
ページ数4
ISBN(電子版)9781538642603
DOI
出版ステータスPublished - 2018 6 5
イベント2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018 - Hsinchu, Taiwan, Province of China
継続期間: 2018 4 162018 4 19

出版物シリーズ

名前2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018

Other

Other2018 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2018
国/地域Taiwan, Province of China
CityHsinchu
Period18/4/1618/4/19

ASJC Scopus subject areas

  • 安全性、リスク、信頼性、品質管理
  • 制御と最適化
  • ハードウェアとアーキテクチャ
  • 電子工学および電気工学

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