TY - GEN
T1 - Highly sensitive location method of an abnormal temperature point in a cable by frequency domain reflectometry
AU - Ohki, Yoshimichi
AU - Hirai, Naoshi
AU - Yamada, Takayuki
AU - Kumagai, Susumu
PY - 2013/12/1
Y1 - 2013/12/1
N2 - This paper demonstrates that it is possible to locate very precisely a point showing a high temperature in a polymer insulated cable. A coaxial communication cable with a length of 32 m insulated by low density polyethylene or a flat inhouse electric cord with a length of 21 m insulated by polyvinyl chloride was heated at different positions for different lengths. The ratio between the incident and reflected powers of electromagnetic waves was measured using a network analyzer in a wide frequency range and the obtained spectra were analyzed by inverse Fourier transform. As a result, the position exhibiting a temperature higher than the adjacent points can be located with a spatial resolution as short as 2.5 cm.
AB - This paper demonstrates that it is possible to locate very precisely a point showing a high temperature in a polymer insulated cable. A coaxial communication cable with a length of 32 m insulated by low density polyethylene or a flat inhouse electric cord with a length of 21 m insulated by polyvinyl chloride was heated at different positions for different lengths. The ratio between the incident and reflected powers of electromagnetic waves was measured using a network analyzer in a wide frequency range and the obtained spectra were analyzed by inverse Fourier transform. As a result, the position exhibiting a temperature higher than the adjacent points can be located with a spatial resolution as short as 2.5 cm.
KW - Temperature monitoring
KW - cable
KW - frequency domain reflectometry
KW - insulation diagnosis
KW - location of degradation
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U2 - 10.1109/ICSD.2013.6619799
DO - 10.1109/ICSD.2013.6619799
M3 - Conference contribution
AN - SCOPUS:84891597062
SN - 9781479908073
T3 - Proceedings of IEEE International Conference on Solid Dielectrics, ICSD
SP - 117
EP - 120
BT - ICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics
T2 - ICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics
Y2 - 30 June 2013 through 4 July 2013
ER -