Strained InxGa1-xN quantum wells (QWs) on thick GaN base layers were investigated to verify the importance of localized QW excitons in their spontaneous emission mechanisms. A strength of the internal piezoelectric field (FPZ) across the QW increases with increasing x up to 1.4 MV/cm for x = 0.25, since the in-plain strain increases. For the QWs with the well thickness L greater than 3 nm, FPZ dominates the emission peak energy due to the quantum-confined Stark effect. Absorption spectra of both hexagonal and cubic InGaN QWs exhibited a broad band-tail regardless of the presence of FPZ normal to the QW plane. The luminescence peak energy of the 3 nm thick QWs was higher than the bandgap energy of the unstrained bulk crystal for x < 0.15, showing that doping of Si in barriers or injection of carriers effectively screens the field. The emission lifetime increased with increasing monitoring wavelength. Also, a temperature-induced change in the luminescence peak energy decreased with increasing x. The real-space variation of the luminescence peak energy was confirmed by the spatially-resolved monochromatic cathodoluminescence mapping method. The localization depth increases with increasing x. The carrier localization is confirmed to originate from the effective bandgap inhomogeneity due to a fluctuation of the local InN mole fraction, which is enhanced by the large and composition-dependent bowing parameter of InGaN material.
|ジャーナル||Physica Status Solidi (A) Applied Research|
|出版ステータス||Published - 2001 1 1|
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