Improved launch for higher TDF coverage with fewer test patterns

研究成果: Article

抜粋

Due to the limitations of scan structure, the second vector in transition delay test is usually applied either by shift operation or by functional launch, which possibly results in unsatisfying transition delay fault (TDF) coverage. To overcome such a limitation for higher TDF coverage, a novel improved launch delay test technique that combines the pros of launch-on-shift and launch-on-capture tests is introduced in this paper. The proposed method can achieve near perfect TDF coverage with fewer test patterns without the need for a global fast scan enable signal. Experimental results on ISCAS89 and ITC99 benchmark circuits are included to show the effectiveness of the proposed method.

元の言語English
記事番号5512687
ページ(範囲)1294-1299
ページ数6
ジャーナルIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
29
発行部数8
DOI
出版物ステータスPublished - 2010 8 1

ASJC Scopus subject areas

  • Software
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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