In-flight performance of the Canadian Astro-H Metrology System

Luigi C. Gallo, Alexander Koujelev, Stéphane Gagnon, Timothy Elgin, Martin Guibert, Ryo Iizuka, Manabu Ishida, Kosei Ishimura, Naoko Iwata, Taro Kawano, Casey Lambert, Franco Moroso, Shiro Ueno, Takayuki Yuasa

研究成果: Article

4 引用 (Scopus)


The Canadian Astro-H Metrology System (CAMS) on the Hitomi x-ray satellite is a laser alignment system that measures the lateral displacement (X/Y) of the extensible optical bench (EOB) along the optical axis of the hard x-ray telescopes (HXTs). The CAMS consists of two identical units that together can be used to discern translation and rotation of the deployable element along the axis. This paper presents the results of in-flight usage of the CAMS during deployment of the EOB and during two observations (Crab and G21.5-0.9) with the HXTs. The CAMS was extremely important during the deployment operation by providing real-time positioning information of the EOB with micrometer-scale resolution. We show how the CAMS improves data quality coming from the hard x-ray imagers. Moreover, we demonstrate that a metrology system is even more important as the angular resolution of the telescope increases. Such a metrology system will be an indispensable tool for future high-resolution x-ray imaging missions.

ジャーナルJournal of Astronomical Telescopes, Instruments, and Systems
出版物ステータスPublished - 2018 4 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Instrumentation
  • Astronomy and Astrophysics
  • Mechanical Engineering
  • Space and Planetary Science

フィンガープリント In-flight performance of the Canadian Astro-H Metrology System' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Gallo, L. C., Koujelev, A., Gagnon, S., Elgin, T., Guibert, M., Iizuka, R., Ishida, M., Ishimura, K., Iwata, N., Kawano, T., Lambert, C., Moroso, F., Ueno, S., & Yuasa, T. (2018). In-flight performance of the Canadian Astro-H Metrology System. Journal of Astronomical Telescopes, Instruments, and Systems, 4(2), [021405].