In situ Raman spectroscopy observation of crystallization process of sol-gel derived Bi4-xLaxTi3O12 films

Naoki Sugita*, Eisuke Tokumitsu, Minoru Osada, Masato Kakihana

*この研究の対応する著者

研究成果: Article査読

39 被引用数 (Scopus)

抄録

In situ Raman spectra measurements have been employed to reveal the crystallization process of sol-gel derived Bi4-xLaxTi3O12 (BLT) thin films. The Raman spectra of BLT films with a La composition x of 0.75 were measured with increasing temperature up to 800°C in air and N2 ambient. It is demonstrated that Bi2O2 layered structures form first at 500°C and perovskite structures start to crystallize at 600°C or higher.

本文言語English
ジャーナルJapanese Journal of Applied Physics, Part 2: Letters
42
8 A
出版ステータスPublished - 2003 8月 1
外部発表はい

ASJC Scopus subject areas

  • 物理学および天文学(その他)

フィンガープリント

「In situ Raman spectroscopy observation of crystallization process of sol-gel derived Bi4-xLaxTi3O12 films」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル