In situ scanning electron microscopy of graphene nucleation during segregation of carbon on polycrystalline Ni substrate

Yuta Momiuchi*, Kazuki Yamada, Hiroki Kato, Yoshikazu Homma, Hiroki Hibino, Genki Odahara, Chuhei Oshima

*この研究の対応する著者

    研究成果: Article査読

    9 被引用数 (Scopus)

    抄録

    In situ scanning electron microscopy (SEM) was used for observing the nucleation of graphene by segregation of bulk-dissolved carbon on a flat polycrystalline nickel surface. Preferential nucleation sites were determined on large (111) grains. In combination with ex situ atomic force microscopy measurements at the same area as with SEM, the nucleation sites were found to have step-bunched structures. Possible nucleation mechanisms are discussed based on the difference in the carbon concentration and critical nucleus size between the (111) terrace and step bunches.

    本文言語English
    論文番号455301
    ジャーナルJournal of Physics D: Applied Physics
    47
    45
    DOI
    出版ステータスPublished - 2014 11月 12

    ASJC Scopus subject areas

    • 凝縮系物理学
    • 電子材料、光学材料、および磁性材料
    • 音響学および超音波学
    • 表面、皮膜および薄膜

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