TY - JOUR
T1 - In Situ Scanning Tunneling Microscopy Observation of Electroless-Deposited NiP Film
AU - Homma, Takayuki
AU - Yamazaki, Takuya
AU - Kubota, Toshimoto
AU - Osaka, Tetsuya
PY - 1990/11
Y1 - 1990/11
N2 - Preliminary results of an in situ scanning tunneling microscopy (STM) observation of electroless-deposited NiP film as well as that of electrodeposited film were demonstrated. The electroless-deposited film is observed to develop rough features consisting of small grains, suggesting the successive nucleation of the grains and their three-dimensional growth. The electro-deposited film, in contrast, consists of larger grains with smooth features.
AB - Preliminary results of an in situ scanning tunneling microscopy (STM) observation of electroless-deposited NiP film as well as that of electrodeposited film were demonstrated. The electroless-deposited film is observed to develop rough features consisting of small grains, suggesting the successive nucleation of the grains and their three-dimensional growth. The electro-deposited film, in contrast, consists of larger grains with smooth features.
KW - Electroless-plating
KW - In situ observation
KW - Initial deposition process
KW - Scanning tunneling microscopy
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U2 - 10.1143/JJAP.29.L2114
DO - 10.1143/JJAP.29.L2114
M3 - Article
AN - SCOPUS:4244218220
SN - 0021-4922
VL - 29
SP - L2114-L2117
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
IS - 11
ER -