Informative sequential selection of variable-sized patches for image retrieval

Zhihao Shen, Hosun Lee, Sungmoon Jeong, Nak Young Chong

研究成果: Conference contribution

抄録

To quickly and efficiently analyze a large-scale environment by the camera with limited field-of-view, intelligent systems should sequentially select the optimal field-of-view to observe an important and informative patch of area. Especially in the image retrieval task, small observations should be sequentially selected to increase the performance of image retrieval and the updated performance can be used to select the next best view again in a cyclic process. In this paper, we have investigated the role of selected image patches, which can be either overlapped or non-overlapped with previous observations, in this cyclic process. To evaluate the different patch selection strategies, the adaptive observation selection method is also described as follows: (1) robots select adaptive observations sequentially based on its prior knowledge from the training dataset. (2) After each selection, the prior knowledge will be updated by discarding the target-irrelevant data for the next observation selection. During this process, we have shown that an informative patch, even though a part of selected patch is already observed at previous steps, can enhance the retrieval accuracy and it has better performance than an independent observation method.

本文言語English
ホスト出版物のタイトル2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
出版社Institute of Electrical and Electronics Engineers Inc.
ページ1169-1172
ページ数4
ISBN(電子版)9784907764579
DOI
出版ステータスPublished - 2017 11月 10
外部発表はい
イベント56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017 - Kanazawa, Japan
継続期間: 2017 9月 192017 9月 22

出版物シリーズ

名前2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
2017-November

Other

Other56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
国/地域Japan
CityKanazawa
Period17/9/1917/9/22

ASJC Scopus subject areas

  • コンピュータ サイエンスの応用
  • 制御と最適化
  • 制御およびシステム工学
  • 器械工学

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