Ion deflector of an ionization gauge for extreme high vacuum

A. Otuka, C. Oshima

研究成果: Article

27 引用 (Scopus)

抜粋

An ion deflector of an ionization pressure gauge for an extreme high vacuum use has been developed. On the basis of the calculated ion trajectories, the optimum deflection angles of the electrostatic cylindrical deflector have been determined versus the electrode gap: an excellent focusing of ion beam has been established at the optimum angles. This is important in order to use the channeltron and to remove the electron stimulated desorption (ESD) noise from the signals. We have realized a high efficiency of ion collection together with a large reduction of the two noises of soft x-ray photoemission current and ESD ions by using the ion deflector.

元の言語English
ページ(範囲)240-244
ページ数5
ジャーナルJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
11
発行部数1
DOI
出版物ステータスPublished - 1993 1

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

フィンガープリント Ion deflector of an ionization gauge for extreme high vacuum' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用