抄録
We propose a just-on-surface magnetic force microscope (JS-MFM) for advanced spatial resolution of magnetic stray field image. In this letter, we describe that the JS-MFM provides better resolution of the stray field image than that in conventional magnetic force microscope, theoretically and experimentally. In the rough estimations, magnetic stray field image just on the surface provides higher resolution of less than 10 nm. In the experiments, initial results demonstrate that JS-MFM can observe a localized surface magnetic stray field caused by small magnetizations in the perpendicularly recorded magnetic domains with a high resolution of around 10 nm.
本文言語 | English |
---|---|
ページ(範囲) | 3407-3409 |
ページ数 | 3 |
ジャーナル | Applied Physics Letters |
巻 | 65 |
号 | 26 |
DOI | |
出版ステータス | Published - 1994 |
外部発表 | はい |
ASJC Scopus subject areas
- 物理学および天文学(その他)