Local Zener phenomenon. A mechanism of p-n junction leakage current

Kiyonori Ohyu, Atsushi Hiraiwa

研究成果: Conference contribution

9 引用 (Scopus)

抄録

The origin of the extremely large p-n junction leakage current which is due neither to generation-recombination current nor diffusion current is investigated. It is shown to be due to the local Zener effect, induced by the local enhancement of the electric field around precipitates in the depletion layer. A new approach to suppress this Zener effect by controlling the profile of the electric field is also proposed.

元の言語English
ホスト出版物のタイトルConference on Solid State Devices and Materials
出版場所Tokyo, Japan
出版者Publ by Business Cent for Acad Soc Japan
ページ73-75
ページ数3
出版物ステータスPublished - 1992
外部発表Yes
イベントExtended Abstracts of the 1992 International Conference on Solid State Devices and Materials - SSDM '92 - Tsukuba, Jpn
継続期間: 1992 8 261992 8 28

Other

OtherExtended Abstracts of the 1992 International Conference on Solid State Devices and Materials - SSDM '92
Tsukuba, Jpn
期間92/8/2692/8/28

Fingerprint

Zener effect
Leakage currents
Electric fields
Precipitates

ASJC Scopus subject areas

  • Engineering(all)

これを引用

Ohyu, K., & Hiraiwa, A. (1992). Local Zener phenomenon. A mechanism of p-n junction leakage current. : Conference on Solid State Devices and Materials (pp. 73-75). Tokyo, Japan: Publ by Business Cent for Acad Soc Japan.

Local Zener phenomenon. A mechanism of p-n junction leakage current. / Ohyu, Kiyonori; Hiraiwa, Atsushi.

Conference on Solid State Devices and Materials. Tokyo, Japan : Publ by Business Cent for Acad Soc Japan, 1992. p. 73-75.

研究成果: Conference contribution

Ohyu, K & Hiraiwa, A 1992, Local Zener phenomenon. A mechanism of p-n junction leakage current. : Conference on Solid State Devices and Materials. Publ by Business Cent for Acad Soc Japan, Tokyo, Japan, pp. 73-75, Extended Abstracts of the 1992 International Conference on Solid State Devices and Materials - SSDM '92, Tsukuba, Jpn, 92/8/26.
Ohyu K, Hiraiwa A. Local Zener phenomenon. A mechanism of p-n junction leakage current. : Conference on Solid State Devices and Materials. Tokyo, Japan: Publ by Business Cent for Acad Soc Japan. 1992. p. 73-75
Ohyu, Kiyonori ; Hiraiwa, Atsushi. / Local Zener phenomenon. A mechanism of p-n junction leakage current. Conference on Solid State Devices and Materials. Tokyo, Japan : Publ by Business Cent for Acad Soc Japan, 1992. pp. 73-75
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