Location Attempt of Multiple Heated Spots in a Polymer-insulated Coaxial Cable by Frequency Domain Reflectometry

研究成果: Conference contribution

2 引用 (Scopus)

抜粋

We already reported that a combination of frequency domain reflectometry (FDR) and inverse fast-Fourier transform (IFFT) is a powerful tool for locating the position where an abnormality or degradation occurs in a cable up to a length of around 1,000 m. In our previous research, we always set a single spot of abnormality. This paper shows that this method is also applicable if abnormalities occur simultaneously at more than one spot. A coaxial cable of 31.5 m, insulated with low-density polyethylene, was heated at two different positions using two heating chambers. Each heated portion was about 47 cm long. The portion closer to the measurement terminal was heated to various temperatures up to 100°C, while the other portion was heated to 100 °C. As a result, it was confirmed that the two portions can be located if the temperature of the heated spot is 10°C higher than the surroundings when the highest measurement frequency is above 800 MHz.

元の言語English
ホスト出版物のタイトル2018 Condition Monitoring and Diagnosis, CMD 2018 - Proceedings
編集者Ahmed Abu-Siada
出版者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子版)9781538641262
DOI
出版物ステータスPublished - 2018 11 14
イベント7th International Conference on Condition Monitoring and Diagnosis, CMD 2018 - Perth, Australia
継続期間: 2018 9 232018 9 26

Other

Other7th International Conference on Condition Monitoring and Diagnosis, CMD 2018
Australia
Perth
期間18/9/2318/9/26

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Signal Processing
  • Energy Engineering and Power Technology
  • Safety, Risk, Reliability and Quality

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  • これを引用

    Hirai, N., & Ohki, Y. (2018). Location Attempt of Multiple Heated Spots in a Polymer-insulated Coaxial Cable by Frequency Domain Reflectometry. : A. Abu-Siada (版), 2018 Condition Monitoring and Diagnosis, CMD 2018 - Proceedings [8535734] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CMD.2018.8535734