Low-glancing-angle x-ray diffraction study on the relationship between crystallinity and properties of C60 field effect transistor
Hirotaka Ohashi*, Katsumi Tanigaki, Ryotaro Kumashiro, Syuji Sugihara, Nobuya Hiroshiba, Shigeru Kimura, Kenichi Kato, Masaki Takata
*この研究の対応する著者
研究成果: Article › 査読
23
被引用数
(Scopus)