Low-temperature field emission system for development of ultracoherent electron beams

B. Cho*, T. Ogawa, T. Ichimura, T. Ichinokawa, T. Amakusa, C. Oshima

*この研究の対応する著者

研究成果: Article査読

8 被引用数 (Scopus)

抄録

Here, we present the design and test-operation performance of a low-temperature field emission (FE) system which can be employed to image and characterize the FE beam from low-temperature tips. Three radiation shields cooled by liquid helium and liquid nitrogen cryostats surround the FE tips and anodes completely. Once the FE system is cooled down to 5 K, experiments can run for more than 15 h without interruption. The design allows not only for the exchange of tips and anodes by load-lock equipment but also for the adjustment of tip-anode distance using a piezo-tube. Test runs in projection microscopy mode have presented clear diffraction-fringe patterns near the shadows of nano objects at temperatures from room temperature to 5.5 K, indicating that the system is well suited for the investigation of the coherence of electron beam from FE tip.

本文言語English
ページ(範囲)3091-3096
ページ数6
ジャーナルReview of Scientific Instruments
75
10 I
DOI
出版ステータスPublished - 2004 10月

ASJC Scopus subject areas

  • 器械工学
  • 物理学および天文学(その他)

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