Low-temperature X-ray powder diffraction of Bi2Sr2CaCu2Ox superconductor

S. Kano, Atsushi Yamazaki, R. Otsuka, M. Ohgaki, S. Nakamura, M. Akao, H. Aoki

    研究成果: Article

    抜粋

    A low-temperature X-ray powder diffractometer has been developed and applied to the measurement of lattice constants of Bi2Sr2CaCu2Ox superconductor at 80 K, only 3 K higher than the critical temperature. The relationship between the lattice constants and electrical resistivity was studied. The Bi2Sr2CaCu2Ox sample was prepared by solid-state reaction and sintered by a hot-press system at 750°C. Lattice constants of the Bi2Sr2CaCu2Cx were measured at 293 to 80 K. The electrical resistivity of the sample, measured by the standard four-probe method, reached 0 Ω cm at 77 K. The resistivity decreased rapidly along with rapid shrinkage of the c-axial length.

    元の言語English
    ページ(範囲)249-253
    ページ数5
    ジャーナルPhase Transitions
    41
    発行部数1-4
    DOI
    出版物ステータスPublished - 1993 1 1

      フィンガープリント

    ASJC Scopus subject areas

    • Materials Science(all)
    • Instrumentation

    これを引用

    Kano, S., Yamazaki, A., Otsuka, R., Ohgaki, M., Nakamura, S., Akao, M., & Aoki, H. (1993). Low-temperature X-ray powder diffraction of Bi2Sr2CaCu2Ox superconductor. Phase Transitions, 41(1-4), 249-253. https://doi.org/10.1080/01411599308207787