Low-temperature X-ray powder diffraction of Bi2Sr2CaCu2Ox superconductor

S. Kano, A. Yamazaki, R. Otsuka, M. Ohgaki, S. Nakamura, M. Akao, H. Aoki

研究成果: Article査読

抄録

A low-temperature X-ray powder diffractometer has been developed and applied to the measurement of lattice constants of Bi2Sr2CaCu2Ox superconductor at 80 K, only 3 K higher than the critical temperature. The relationship between the lattice constants and electrical resistivity was studied. The Bi2Sr2CaCu2Ox sample was prepared by solid-state reaction and sintered by a hot-press system at 750°C. Lattice constants of the Bi2Sr2CaCu2Cx were measured at 293 to 80 K. The electrical resistivity of the sample, measured by the standard four-probe method, reached 0 Ω cm at 77 K. The resistivity decreased rapidly along with rapid shrinkage of the c-axial length.

本文言語English
ページ(範囲)249-253
ページ数5
ジャーナルPhase Transitions
41
1-4
DOI
出版ステータスPublished - 1993 1 1

ASJC Scopus subject areas

  • 器械工学
  • 材料科学(全般)

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「Low-temperature X-ray powder diffraction of Bi<sub>2</sub>Sr<sub>2</sub>CaCu<sub>2</sub>O<sub>x</sub> superconductor」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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