Measurement of hole mobility in dielectric liquids

N. Hirai*, K. Arii, H. Kikuchi, T. Masoaka, H. Nitanada

*この研究の対応する著者

研究成果: Conference contribution

抄録

Breakdown phenomena of dielectric liquids for a needle/plane electrode have been investigated. It was evident the hole influenced greatly the breakdown of dielectric liquids. In this paper, we report hole production and measurement of hole mobility in dielectric liquids. The electron and hole were injected from NESA glass electrode into cyclohexane by the irradiation of KrF excimer laser. The NESA was coated with ITO (Indium tin oxide). The analysis of electron and hole mobility is discussed.

本文言語English
ホスト出版物のタイトルProceedings of the 11th International Conference on Conduction and
出版社Publ by IEEE
ページ101-105
ページ数5
ISBN(印刷版)0780307925
出版ステータスPublished - 1993 12 1
外部発表はい
イベントProceedings of the IEEE 11th International Conference on Conduction and Breakdown in Dielectric Liquids (ICDL) - Baden-Dattwil, Switz
継続期間: 1993 7 191993 7 23

出版物シリーズ

名前Proceedings of the 11th International Conference on Conduction and

Other

OtherProceedings of the IEEE 11th International Conference on Conduction and Breakdown in Dielectric Liquids (ICDL)
CityBaden-Dattwil, Switz
Period93/7/1993/7/23

ASJC Scopus subject areas

  • 工学(全般)

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