Measurement of nanometer electron beam sizes using laser interference by Shintake Monitor

Jacqueline Yan, Yoshio Kamiya, Sachio Komamiya, Toshiyuki Okugi, Nobuhiro Terunuma, Kiyoshi Kubo, Toshiaki Tauchi

研究成果: Conference article

抄録

The Shintake Monitor is an essential beam tuning device installed at the interaction point of ATF2, the final focus test beam line for ILC, to measure its O(10) nm order vertical e- beam sizes (σy). The e-beam collides with a target of laser interference fringes, and σy is derived from the modulation depth of the resulting Compton signal photons measured by a downstream photon detector. The laser optics is designed to accommodate a wide range of σy from 25 nm to a few μm with better than 10% accuracy. Being the only existing device capable of measuring σy < 100 nm, the Shintake Monitor is crucial for verifying ATF2's Goal 1 of focusing σy down to the design value of 37 nm. It has demonstrated measurement stability of about 5%. Major improvements in hardware and measurement schemes contributed to suppressing error sources. This paper describes the design concepts and performance of Shintake Monitor, focusing on an extensive study of systematic errors with the aim of precisely extracting σy from the measured modulation.

元の言語English
記事番号127
ジャーナルProceedings of Science
0
出版物ステータスPublished - 2014 1 1
外部発表Yes
イベント3rd Technology and Instrumentation in Particle Physics Conference, TIPP 2014 - Amsterdam, Netherlands
継続期間: 2014 6 22014 6 6

Fingerprint

monitors
electron beams
interference
lasers
modulation
photons
systematic errors
hardware
tuning
optics
detectors
interactions

ASJC Scopus subject areas

  • General

これを引用

Yan, J., Kamiya, Y., Komamiya, S., Okugi, T., Terunuma, N., Kubo, K., & Tauchi, T. (2014). Measurement of nanometer electron beam sizes using laser interference by Shintake Monitor. Proceedings of Science, 0, [127].

Measurement of nanometer electron beam sizes using laser interference by Shintake Monitor. / Yan, Jacqueline; Kamiya, Yoshio; Komamiya, Sachio; Okugi, Toshiyuki; Terunuma, Nobuhiro; Kubo, Kiyoshi; Tauchi, Toshiaki.

:: Proceedings of Science, 巻 0, 127, 01.01.2014.

研究成果: Conference article

Yan, J, Kamiya, Y, Komamiya, S, Okugi, T, Terunuma, N, Kubo, K & Tauchi, T 2014, 'Measurement of nanometer electron beam sizes using laser interference by Shintake Monitor', Proceedings of Science, 巻. 0, 127.
Yan, Jacqueline ; Kamiya, Yoshio ; Komamiya, Sachio ; Okugi, Toshiyuki ; Terunuma, Nobuhiro ; Kubo, Kiyoshi ; Tauchi, Toshiaki. / Measurement of nanometer electron beam sizes using laser interference by Shintake Monitor. :: Proceedings of Science. 2014 ; 巻 0.
@article{862face26150420c81ee9b2bb3242c6e,
title = "Measurement of nanometer electron beam sizes using laser interference by Shintake Monitor",
abstract = "The Shintake Monitor is an essential beam tuning device installed at the interaction point of ATF2, the final focus test beam line for ILC, to measure its O(10) nm order vertical e- beam sizes (σy). The e-beam collides with a target of laser interference fringes, and σy is derived from the modulation depth of the resulting Compton signal photons measured by a downstream photon detector. The laser optics is designed to accommodate a wide range of σy from 25 nm to a few μm with better than 10{\%} accuracy. Being the only existing device capable of measuring σy < 100 nm, the Shintake Monitor is crucial for verifying ATF2's Goal 1 of focusing σy down to the design value of 37 nm. It has demonstrated measurement stability of about 5{\%}. Major improvements in hardware and measurement schemes contributed to suppressing error sources. This paper describes the design concepts and performance of Shintake Monitor, focusing on an extensive study of systematic errors with the aim of precisely extracting σy from the measured modulation.",
author = "Jacqueline Yan and Yoshio Kamiya and Sachio Komamiya and Toshiyuki Okugi and Nobuhiro Terunuma and Kiyoshi Kubo and Toshiaki Tauchi",
year = "2014",
month = "1",
day = "1",
language = "English",
volume = "0",
journal = "Proceedings of Science",
issn = "1824-8039",
publisher = "Sissa Medialab Srl",

}

TY - JOUR

T1 - Measurement of nanometer electron beam sizes using laser interference by Shintake Monitor

AU - Yan, Jacqueline

AU - Kamiya, Yoshio

AU - Komamiya, Sachio

AU - Okugi, Toshiyuki

AU - Terunuma, Nobuhiro

AU - Kubo, Kiyoshi

AU - Tauchi, Toshiaki

PY - 2014/1/1

Y1 - 2014/1/1

N2 - The Shintake Monitor is an essential beam tuning device installed at the interaction point of ATF2, the final focus test beam line for ILC, to measure its O(10) nm order vertical e- beam sizes (σy). The e-beam collides with a target of laser interference fringes, and σy is derived from the modulation depth of the resulting Compton signal photons measured by a downstream photon detector. The laser optics is designed to accommodate a wide range of σy from 25 nm to a few μm with better than 10% accuracy. Being the only existing device capable of measuring σy < 100 nm, the Shintake Monitor is crucial for verifying ATF2's Goal 1 of focusing σy down to the design value of 37 nm. It has demonstrated measurement stability of about 5%. Major improvements in hardware and measurement schemes contributed to suppressing error sources. This paper describes the design concepts and performance of Shintake Monitor, focusing on an extensive study of systematic errors with the aim of precisely extracting σy from the measured modulation.

AB - The Shintake Monitor is an essential beam tuning device installed at the interaction point of ATF2, the final focus test beam line for ILC, to measure its O(10) nm order vertical e- beam sizes (σy). The e-beam collides with a target of laser interference fringes, and σy is derived from the modulation depth of the resulting Compton signal photons measured by a downstream photon detector. The laser optics is designed to accommodate a wide range of σy from 25 nm to a few μm with better than 10% accuracy. Being the only existing device capable of measuring σy < 100 nm, the Shintake Monitor is crucial for verifying ATF2's Goal 1 of focusing σy down to the design value of 37 nm. It has demonstrated measurement stability of about 5%. Major improvements in hardware and measurement schemes contributed to suppressing error sources. This paper describes the design concepts and performance of Shintake Monitor, focusing on an extensive study of systematic errors with the aim of precisely extracting σy from the measured modulation.

UR - http://www.scopus.com/inward/record.url?scp=85011623260&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85011623260&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:85011623260

VL - 0

JO - Proceedings of Science

JF - Proceedings of Science

SN - 1824-8039

M1 - 127

ER -