Measurement of nanometer electron beam sizes with laser interference using IPBSM

Jacqueline Yan, Sachio Komamiya, Masahiro Oroku, Taikan Suehara, Yohei Yamaguchi, Takashi Yamanaka, Yoshio Kamiya, Sakae Araki, Toshiyuki Okugi, Toshiaki Tauchi, Nobuhiro Terunuma, Junji Urakawa

研究成果: Conference contribution

抄録

An e- beam size monitor, called the “Shintake Monitor” (or “IPBSM”), is installed at ATF2’s virtual interaction point (“IP”). It plays a crucial role in achieving ATF2’s Goal 1 of focusing the vertical e- beam size (σy*) down to a design value of 37 nm, using an ingenious technique of colliding the e- beam against a target of laser interference fringes. σy* is derived from the modulation depth of the resulting Compton signal photons measured by a downstream γ detector. IPBSM is the only existing device capable of measuring σy* as small as 20 nm with better than 10% resolution, and can accommodate a wide range of σy* up to a few μm by switching between laser crossing angles θ = 174°, 30°, and 2° - 8° according to beam tuning status. The effects of several major hardware upgrades have been confirmed during beam time, such as through suppressed signal jitters, improved resolution and stable measurements of σy* down to about 150 nm by Feb 2012. The aims of the extensive 2012 summer reform implemented upon the laser optics are higher reliability and reproducibility in alignment. Our goal for the autumn 2012 run is to stably measure σy* < 50 nm. This paper describes the system’s design, role in beam tuning, and various efforts to further improve its performance.

本文言語English
ホスト出版物のタイトルIBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference
出版社Joint Accelerator Conferences Website (JACoW)
ページ310-314
ページ数5
ISBN(電子版)9783954501199
出版ステータスPublished - 2013 6 1
外部発表はい
イベント1st International Beam Instrumentation Conference, IBIC 2012 - Tsukuba, Japan
継続期間: 2012 10 12012 10 4

出版物シリーズ

名前IBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference

Conference

Conference1st International Beam Instrumentation Conference, IBIC 2012
CountryJapan
CityTsukuba
Period12/10/112/10/4

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

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