Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer

S. Shiraki, H. Ishii, M. Amano, Y. Nihei, M. Owari, C. Oshima, T. Koshikawa, R. Shimizu

研究成果: Article査読

9 被引用数 (Scopus)

抄録

We have developed an angle-resolving electron energy analyzer with a newly designed input-lens system. In this lens system, angle resolving is accomplished by use of a diffraction-plane aperture. Using this system, both high angular resolution (<0.1°) and high transmission are easily achieved in photoelectron diffraction measurements. In order to evaluate this analyzer, we measured the X-ray photoelectron diffraction (XPED) patterns from CaF2(1 1 1) surface. The angular resolution is easily determined by the size of diffraction-plane aperture. By using the diffraction-plane aperture with the angular resolution of ±0.08° or ±0.04°, many fine structures of XPED patterns become to be clearly measured.

本文言語English
ページ(範囲)29-35
ページ数7
ジャーナルSurface Science
493
1-3
DOI
出版ステータスPublished - 2001 11 1

ASJC Scopus subject areas

  • 物理化学および理論化学
  • 凝縮系物理学
  • 表面および界面

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