Micro x-ray diffraction technique for analysis of the local layer structure in the ferroelectric liquid crystal

A. Iida*, T. Noma, H. Miyata, K. Hirano

*この研究の対応する著者

研究成果: Article査読

6 被引用数 (Scopus)

抄録

A hard x-ray microprobe has been developed for small-angle x-ray diffraction studies. The x-ray microprobe system consists of a multilayer monochromator in combination with x-ray focusing mirrors (Kirkpatrick-Baez type) and achieves both high spatial resolution (5×5 μm at the sample) and high angular resolution (about 0.6 and 0.2 mrad in horizontal and vertical directions, respectively). The local layer structure of the surface stabilized ferroelectric liquid crystals was determined, for the first time, directly with this arrangement. Advantages of x-ray microbeam topography are also discussed.

本文言語English
ページ(範囲)1373-1375
ページ数3
ジャーナルReview of Scientific Instruments
66
2
DOI
出版ステータスPublished - 1995
外部発表はい

ASJC Scopus subject areas

  • 器械工学

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