Micrositructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media

J. Kawaji; T. Asahi; H. Hashimoto; J. Hokkyo; T. Osaka; S. Matsunuma; G. Sáfrán; J. Ariake; K. Ouchi

doi:10.1063/1.1736324

Micrositructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media

J. Kawaji^*, T. Asahi, H. Hashimoto, J. Hokkyo, T. Osaka, S. Matsunuma, G. Sáfrán, J. Ariake, K. Ouchi

^*この研究の対応する著者

研究成果 › 査読

14 被引用数 (Scopus)

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The microstructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media were studied. The Pd/Si seed layer, sputter deposited under Ar sputtering gas containing N₂ and postannealed at 400°C reduced intergranular exchange coupling of the Co/Pd multilayered films. It was observed that the addition of N₂ gas effectively decreased the grain size of Pd in the seed layer. It was found that the Pd/Si seed layer prepared with both processes exhibited a granular structure of fine Pd-rich grains surrounded by a Si-rich amorphous region.

本文言語	English
ページ（範囲）	8023-8029
ページ数	7
ジャーナル	Journal of Applied Physics
巻	95
号	12
DOI	https://doi.org/10.1063/1.1736324
出版ステータス	Published - 2004 6月 15

ASJC Scopus subject areas

物理学および天文学（全般）

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10.1063/1.1736324

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abstract = "The microstructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media were studied. The Pd/Si seed layer, sputter deposited under Ar sputtering gas containing N2 and postannealed at 400°C reduced intergranular exchange coupling of the Co/Pd multilayered films. It was observed that the addition of N2 gas effectively decreased the grain size of Pd in the seed layer. It was found that the Pd/Si seed layer prepared with both processes exhibited a granular structure of fine Pd-rich grains surrounded by a Si-rich amorphous region.",

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AU - Kawaji, J.

AU - Asahi, T.

AU - Hashimoto, H.

AU - Hokkyo, J.

AU - Osaka, T.

AU - Matsunuma, S.

AU - Sáfrán, G.

AU - Ariake, J.

AU - Ouchi, K.

PY - 2004/6/15

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AB - The microstructure and magnetic properties of a Co/Pd multilayer on a controlled Pd/Si seed layer for double-layered perpendicular magnetic recording media were studied. The Pd/Si seed layer, sputter deposited under Ar sputtering gas containing N2 and postannealed at 400°C reduced intergranular exchange coupling of the Co/Pd multilayered films. It was observed that the addition of N2 gas effectively decreased the grain size of Pd in the seed layer. It was found that the Pd/Si seed layer prepared with both processes exhibited a granular structure of fine Pd-rich grains surrounded by a Si-rich amorphous region.

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