Modeling the overshooting effect for CMOS inverter delay analysis in nanometer technologies

Zhangcai Huang, Atsushi Kurokawa, Masanori Hashimoto, Takashi Sato, Minglu Jiang, Yasuaki Inoue

    研究成果: Article

    31 引用 (Scopus)

    抄録

    With the scaling of complementary metal-oxide-semiconductor (CMOS) technology into the nanometer regime, the overshooting effect due to the input-to-output coupling capacitance has more significant influence on CMOS gate analysis, especially on CMOS gate static timing analysis. In this paper, the overshooting effect is modeled for CMOS inverter delay analysis in nanometer technologies. The results produced by the proposed model are close to simulation program with integrated circuit emphasis (SPICE). Moreover, the influence of the overshooting effect on CMOS inverter analysis is discussed. An analytical model is presented to calculate the CMOS inverter delay time based on the proposed overshooting effect model, which is verified to be in good agreement with SPICE results. Furthermore, the proposed model is used to improve the accuracy of the switch-resistor model for approximating the inverter output waveform.

    元の言語English
    記事番号5395729
    ページ(範囲)250-260
    ページ数11
    ジャーナルIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
    29
    発行部数2
    DOI
    出版物ステータスPublished - 2010 2

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    Metals
    Integrated circuits
    Resistors
    Oxide semiconductors
    Analytical models
    Time delay
    Capacitance
    Switches

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Computer Graphics and Computer-Aided Design
    • Software

    これを引用

    Modeling the overshooting effect for CMOS inverter delay analysis in nanometer technologies. / Huang, Zhangcai; Kurokawa, Atsushi; Hashimoto, Masanori; Sato, Takashi; Jiang, Minglu; Inoue, Yasuaki.

    :: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 巻 29, 番号 2, 5395729, 02.2010, p. 250-260.

    研究成果: Article

    Huang, Zhangcai ; Kurokawa, Atsushi ; Hashimoto, Masanori ; Sato, Takashi ; Jiang, Minglu ; Inoue, Yasuaki. / Modeling the overshooting effect for CMOS inverter delay analysis in nanometer technologies. :: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2010 ; 巻 29, 番号 2. pp. 250-260.
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    abstract = "With the scaling of complementary metal-oxide-semiconductor (CMOS) technology into the nanometer regime, the overshooting effect due to the input-to-output coupling capacitance has more significant influence on CMOS gate analysis, especially on CMOS gate static timing analysis. In this paper, the overshooting effect is modeled for CMOS inverter delay analysis in nanometer technologies. The results produced by the proposed model are close to simulation program with integrated circuit emphasis (SPICE). Moreover, the influence of the overshooting effect on CMOS inverter analysis is discussed. An analytical model is presented to calculate the CMOS inverter delay time based on the proposed overshooting effect model, which is verified to be in good agreement with SPICE results. Furthermore, the proposed model is used to improve the accuracy of the switch-resistor model for approximating the inverter output waveform.",
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    AU - Kurokawa, Atsushi

    AU - Hashimoto, Masanori

    AU - Sato, Takashi

    AU - Jiang, Minglu

    AU - Inoue, Yasuaki

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    AB - With the scaling of complementary metal-oxide-semiconductor (CMOS) technology into the nanometer regime, the overshooting effect due to the input-to-output coupling capacitance has more significant influence on CMOS gate analysis, especially on CMOS gate static timing analysis. In this paper, the overshooting effect is modeled for CMOS inverter delay analysis in nanometer technologies. The results produced by the proposed model are close to simulation program with integrated circuit emphasis (SPICE). Moreover, the influence of the overshooting effect on CMOS inverter analysis is discussed. An analytical model is presented to calculate the CMOS inverter delay time based on the proposed overshooting effect model, which is verified to be in good agreement with SPICE results. Furthermore, the proposed model is used to improve the accuracy of the switch-resistor model for approximating the inverter output waveform.

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