Multi-objective optimization approach with job-based encoding method for semiconductor final testing scheduling problem

Yi Sun*, Xin Wei, Shigeru Fujimura, Genke Yang

*この研究の対応する著者

研究成果: Conference contribution

1 被引用数 (Scopus)

抄録

The semiconductor final testing scheduling problem (SFTSP) is a variation of the complex scheduling problem, which deals with the arrangement of the job sequence for the final testing process. In this paper, we present an actual SFTSP case includes almost all the flow-shop factors as reentry characteristic, serial and batch processing stages, lot-clusters and parallel machines. Since the critical equipment needs to be utilized efficiently at a specific testing stage, the scheduling arrangement is then playing an important role in order to reduce both the makespan and penalty cost of all late products in total final testing progress. On account of the difficulty and long time it takes to solve this problem, we propose a multi-objective optimization approach, which uses a lot-merging procedure, a new job-based encoding method, and an adjustment to the non-dominated sorting genetic algorithm II (NSGA-II). Simulation results of the adjusted NSGA-II on this SFTSP problem are compared with its traditional algorithm and much better performance of the adjusted one is observed.

本文言語English
ホスト出版物のタイトルManufacturing Science and Technology III
ページ152-157
ページ数6
DOI
出版ステータスPublished - 2013
イベント2012 3rd International Conference on Manufacturing Science and Technology, ICMST 2012 - New Delhi, India
継続期間: 2012 8 182012 8 19

出版物シリーズ

名前Advanced Materials Research
622
ISSN(印刷版)1022-6680

Conference

Conference2012 3rd International Conference on Manufacturing Science and Technology, ICMST 2012
国/地域India
CityNew Delhi
Period12/8/1812/8/19

ASJC Scopus subject areas

  • 工学(全般)

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