Near-duplicate detection using a new framework of constructing accurate affine invariant regions

研究成果: Conference contribution

抄録

In this study, we propose a simple, yet general and powerful framework for constructing accurate affine invariant regions and use it for near-duplicate detection problem. In our framework, a method for extracting reliable seed points is first proposed. Then, regions which are invariant to most common affine transformations are extracted from seed points by a new method named the Thresholding Seeded Growing Region (TSGR). After that, an improved ellipse fitting method based on the Direct Least Square Fitting (DLSF) is used to fit the irregularly-shaped contours of TSGRs to obtain ellipse regions as the final invariant regions. At last, SIFT-PCA descriptors are computed on the obtained regions. In the experiment, our framework is evaluated by retrieving near-duplicate in an image database containing 1000 images. It gives a satisfying result of 96.8% precision at 100% recall.

本文言語English
ホスト出版物のタイトルAdvances in Visual Information Systems - 9th International Conference, VISUAL 2007, Revised Selected Papers
出版社Springer Verlag
ページ61-72
ページ数12
ISBN(印刷版)9783540764137
DOI
出版ステータスPublished - 2007 1 1
イベント9th International Conference on Visual Information Systems, VISUAL 2007 - Shanghai, China
継続期間: 2007 6 282007 6 29

出版物シリーズ

名前Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
4781 LNCS
ISSN(印刷版)0302-9743
ISSN(電子版)1611-3349

Conference

Conference9th International Conference on Visual Information Systems, VISUAL 2007
CountryChina
CityShanghai
Period07/6/2807/6/29

ASJC Scopus subject areas

  • Theoretical Computer Science
  • Computer Science(all)

フィンガープリント 「Near-duplicate detection using a new framework of constructing accurate affine invariant regions」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル