The near fields of electromagnetic waves scattered from two-dimensional slightly rough surfaces are studied by using the stochastic functional approach. The correlation coefficient between the surface and the intensity of the scattered-wave field is investigated to estimate the fidelity of near-field intensity images. We show that the fidelity depends on both the polarization and the angle of incidence and that high fidelity can be obtained by a TM-polarized incident wave whose incident angle is not close to the critical angle of the total reflection.
|ジャーナル||Journal of the Optical Society of America A: Optics and Image Science, and Vision|
|出版ステータス||Published - 2002 2月|
ASJC Scopus subject areas
- コンピュータ ビジョンおよびパターン認識