Near-field intensity distribution of waves scattered from slightly rough surfaces

Tetsuya Kawanishi*

*この研究の対応する著者

研究成果: Article査読

1 被引用数 (Scopus)

抄録

The near fields of electromagnetic waves scattered from two-dimensional slightly rough surfaces are studied by using the stochastic functional approach. The correlation coefficient between the surface and the intensity of the scattered-wave field is investigated to estimate the fidelity of near-field intensity images. We show that the fidelity depends on both the polarization and the angle of incidence and that high fidelity can be obtained by a TM-polarized incident wave whose incident angle is not close to the critical angle of the total reflection.

本文言語English
ページ(範囲)398-403
ページ数6
ジャーナルJournal of the Optical Society of America A: Optics and Image Science, and Vision
19
2
DOI
出版ステータスPublished - 2002 2月
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 原子分子物理学および光学
  • コンピュータ ビジョンおよびパターン認識

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