New method of the precise measurement for the thickness and bulk etch rate of the solid-state track detector

S. Kodaira*, N. Yasuda, Nobuyuki Hasebe, T. Doke, S. Ota, K. Ogura

*この研究の対応する著者

    研究成果: Article査読

    18 被引用数 (Scopus)

    抄録

    New optical system with an optical displacement sensor has been developed to measure the local thickness of CR-39 track detector. It can be applied to measure locally the thicknesses of whole detector area for making a map of the amount of bulk etch. The accuracy of the thicknesses measurement was found to be ± 0.2 μ m using CR-39 detector. This accuracy is one order of magnitude higher than that of conventional methods, such as the Micrometer method, and is comparable to that of track size measurement under the optical microscope. It will also greatly improve the charge and mass resolutions of CR-39 detector that we can apply to measure galactic cosmic rays (GCRs) nuclei, especially the trans-iron nuclei (Z ≥ 30) in GCRs.

    本文言語English
    ページ(範囲)163-170
    ページ数8
    ジャーナルNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
    574
    1
    DOI
    出版ステータスPublished - 2007 4月 21

    ASJC Scopus subject areas

    • 器械工学
    • 核物理学および高エネルギー物理学

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