Nonscalability of alpha-particle-induced charge collection area

T. Tanii*, T. Matsukawa, Sh Mori, M. Koh, B. Shigeta, K. Igarashi, I. Ohdomari

*この研究の対応する著者

研究成果: Article査読

5 被引用数 (Scopus)

抄録

The scalability of alpha-particle-induced soft errors has been evaluated. We have irradiated individual sites in and near a PN-junction area with single alpha particles and measured the charge collected at the junction. As the PN-junction size is reduced, the charge collected by diffusion upon the incidence of alpha particles at the outer area around the junction increases relative to the charge collected upon direct incidence at the junction area. This suggests that the soft-error- sensitive area is not scaled down even if memory cell size is reduced.

本文言語English
ページ(範囲)L688-L690
ジャーナルJapanese Journal of Applied Physics, Part 2: Letters
35
6 A
DOI
出版ステータスPublished - 1996

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(その他)
  • 物理学および天文学(全般)

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