NO2 oxidation beam source by laser ablation

S. Sekine, H. Hashizume, Shingo Ichimura, H. Shimizu

研究成果: Article

抄録

The molecular beam was obtained by a laser ablation of condensed NO2 on a cold substrate. The ejected particles were NO2 molecules and had a sharp angular distribution around surface normal. The translational energy was measured as a function of (1) laser power density and (2) an amount of the adsorbed NO2. The beam had approximately thermal distribution of the translational energy and the temperature was in the range from 200 K to 1200 K. In experiment to demonstrate the beam as an oxygen source the surface of a copper target was fully oxidized to CuO.

元の言語English
ページ(範囲)16-23
ページ数8
ジャーナルDenshi Gijutsu Sogo Kenkyusho Iho/Bulletin of the Electrotechnical Laboratory
57
発行部数4
出版物ステータスPublished - 1993 1 1
外部発表Yes

Fingerprint

Laser ablation
laser ablation
Oxidation
oxidation
Molecular beams
Angular distribution
molecular beams
radiant flux density
angular distribution
Copper
copper
Molecules
Oxygen
energy
Lasers
oxygen
Substrates
lasers
molecules
Experiments

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

これを引用

NO2 oxidation beam source by laser ablation. / Sekine, S.; Hashizume, H.; Ichimura, Shingo; Shimizu, H.

:: Denshi Gijutsu Sogo Kenkyusho Iho/Bulletin of the Electrotechnical Laboratory, 巻 57, 番号 4, 01.01.1993, p. 16-23.

研究成果: Article

@article{434b07b7434341e6b20356948fc80411,
title = "NO2 oxidation beam source by laser ablation",
abstract = "The molecular beam was obtained by a laser ablation of condensed NO2 on a cold substrate. The ejected particles were NO2 molecules and had a sharp angular distribution around surface normal. The translational energy was measured as a function of (1) laser power density and (2) an amount of the adsorbed NO2. The beam had approximately thermal distribution of the translational energy and the temperature was in the range from 200 K to 1200 K. In experiment to demonstrate the beam as an oxygen source the surface of a copper target was fully oxidized to CuO.",
author = "S. Sekine and H. Hashizume and Shingo Ichimura and H. Shimizu",
year = "1993",
month = "1",
day = "1",
language = "English",
volume = "57",
pages = "16--23",
journal = "Denshi Gijutsu Sogo Kenkyusho Iho/Bulletin of the Electrotechnical Laboratory",
issn = "0366-9092",
publisher = "Denshi Gijutsu Sogo Kenkyujo",
number = "4",

}

TY - JOUR

T1 - NO2 oxidation beam source by laser ablation

AU - Sekine, S.

AU - Hashizume, H.

AU - Ichimura, Shingo

AU - Shimizu, H.

PY - 1993/1/1

Y1 - 1993/1/1

N2 - The molecular beam was obtained by a laser ablation of condensed NO2 on a cold substrate. The ejected particles were NO2 molecules and had a sharp angular distribution around surface normal. The translational energy was measured as a function of (1) laser power density and (2) an amount of the adsorbed NO2. The beam had approximately thermal distribution of the translational energy and the temperature was in the range from 200 K to 1200 K. In experiment to demonstrate the beam as an oxygen source the surface of a copper target was fully oxidized to CuO.

AB - The molecular beam was obtained by a laser ablation of condensed NO2 on a cold substrate. The ejected particles were NO2 molecules and had a sharp angular distribution around surface normal. The translational energy was measured as a function of (1) laser power density and (2) an amount of the adsorbed NO2. The beam had approximately thermal distribution of the translational energy and the temperature was in the range from 200 K to 1200 K. In experiment to demonstrate the beam as an oxygen source the surface of a copper target was fully oxidized to CuO.

UR - http://www.scopus.com/inward/record.url?scp=0027313924&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027313924&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0027313924

VL - 57

SP - 16

EP - 23

JO - Denshi Gijutsu Sogo Kenkyusho Iho/Bulletin of the Electrotechnical Laboratory

JF - Denshi Gijutsu Sogo Kenkyusho Iho/Bulletin of the Electrotechnical Laboratory

SN - 0366-9092

IS - 4

ER -