Novel NICE (Nitrogen implantation into CMOS gate electrode and source-drain) structure for high reliability and high performance 0. 25μm dual gate CMOS

T. Kuroi, T. Yamaguchi, M. Shirahata, Y. Okumura, Y. Kawasaki, M. Inuishi, B. Tsubouchi

研究成果: Conference contribution

8 引用 (Scopus)

抜粋

We have proposed a novel structure with high reliability and high performance by nitrogen implantation into gate electrode and source-drain region for 0.25 μm dual gate CMOS. It was founded that the hot carrier resistance of both N-ch and P-ch MOSFETs can be effectively improved by incorporating nitrogen into the gate oxide with nitrogen implantation on the poly silicon gate. Moreover it was founded that Ti-salicided shallow junction for 0.25 μm CMOS can be successfully formed without increasing the junction leakage current.

元の言語English
ホスト出版物のタイトルTechnical Digest - International Electron Devices Meeting
編集者 Anon
出版者Publ by IEEE
ページ324-328
ページ数5
ISBN(印刷物)0780314506
出版物ステータスPublished - 1993 12 1
イベントProceedings of the 1993 IEEE International Electron Devices Meeting - Washington, DC, USA
継続期間: 1993 12 51993 12 8

出版物シリーズ

名前Technical Digest - International Electron Devices Meeting
ISSN(印刷物)0163-1918

Other

OtherProceedings of the 1993 IEEE International Electron Devices Meeting
Washington, DC, USA
期間93/12/593/12/8

    フィンガープリント

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

これを引用

Kuroi, T., Yamaguchi, T., Shirahata, M., Okumura, Y., Kawasaki, Y., Inuishi, M., & Tsubouchi, B. (1993). Novel NICE (Nitrogen implantation into CMOS gate electrode and source-drain) structure for high reliability and high performance 0. 25μm dual gate CMOS. : Anon (版), Technical Digest - International Electron Devices Meeting (pp. 324-328). (Technical Digest - International Electron Devices Meeting). Publ by IEEE.