TY - JOUR
T1 - Oblique incidence ultrasonic reflectometry device based on c-axis tilted ScAlN films for evaluating viscoelastic properties of liquids above 100 MHz
AU - Kinoshita, Sarina
AU - Yanagitani, Takahiko
N1 - Funding Information:
This work was supported by JST CREST (No. JPMJCR20Q1), JST FOREST and KAKENHI (Grant-in-Aid for Scientific Research B, Nos. 19H02202 and 21K18734).
Publisher Copyright:
© 2022 Author(s).
PY - 2022/10/10
Y1 - 2022/10/10
N2 - The ultrasonic complex reflectometry is a powerful tool for evaluating the viscoelastic properties of small liquid samples. However, the shear mode reflectometry device has not been used at frequencies above 100 MHz because shear-mode piezoelectric films are difficult to obtain at such frequencies. Here, the oblique incidence reflectometry with 143 MHz quasi-shear waves excited by c-axis tilted ScAlN thin films was proposed to realize high-sensitivity evaluation of the viscoelastic properties of liquids. Using the prism type reflectometry MEMS, the shear elasticity and shear viscosity of glycerin solutions were estimated from their complex reflection coefficients.
AB - The ultrasonic complex reflectometry is a powerful tool for evaluating the viscoelastic properties of small liquid samples. However, the shear mode reflectometry device has not been used at frequencies above 100 MHz because shear-mode piezoelectric films are difficult to obtain at such frequencies. Here, the oblique incidence reflectometry with 143 MHz quasi-shear waves excited by c-axis tilted ScAlN thin films was proposed to realize high-sensitivity evaluation of the viscoelastic properties of liquids. Using the prism type reflectometry MEMS, the shear elasticity and shear viscosity of glycerin solutions were estimated from their complex reflection coefficients.
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U2 - 10.1063/5.0112070
DO - 10.1063/5.0112070
M3 - Article
AN - SCOPUS:85140473214
VL - 121
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 15
M1 - 152901
ER -