Observing diamond defects with an analytical color fluorescence electron microscope

Kazuhito Nishimura, Tohru Nakano, Hirotami Koike, Hiroshi Tomimori, Hiroshi Kawarada, Akio Hiraki, Kazuo Ogawa

研究成果: Conference contribution

1 引用 (Scopus)

抄録

We have developed an analytical color fluorescence electron microscope (ACFEM) which is now being studied as a possible tool for evaluating diamonds. The ACFEM permits observation using colors corresponding to cathodoluminescence (CL) wavelengths in the visible region (400-700nm) to distinguish the type, size, and distribution of emission centers and emission bands of diamonds. The ACFEM is an effective tool for determing the conditions used for synthesizing chemical vapor deposition (CVD) diamonds, and is far superior to X-PS and SIMS as a tool for analyzing dopants.

元の言語English
ホスト出版物のタイトルProceedings of SPIE - The International Society for Optical Engineering
編集者Albert Feldman, Sandor Holly
出版者Publ by Int Soc for Optical Engineering
ページ267-282
ページ数16
1325
出版物ステータスPublished - 1990
外部発表Yes
イベントDiamond Optics III - San Diego, CA, USA
継続期間: 1990 7 91990 7 11

Other

OtherDiamond Optics III
San Diego, CA, USA
期間90/7/990/7/11

Fingerprint

Diamonds
Electron microscopes
electron microscopes
Fluorescence
diamonds
Color
color
fluorescence
Defects
defects
Cathodoluminescence
Secondary ion mass spectrometry
cathodoluminescence
secondary ion mass spectrometry
Chemical vapor deposition
Doping (additives)
vapor deposition
Wavelength
wavelengths

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

これを引用

Nishimura, K., Nakano, T., Koike, H., Tomimori, H., Kawarada, H., Hiraki, A., & Ogawa, K. (1990). Observing diamond defects with an analytical color fluorescence electron microscope. : A. Feldman, & S. Holly (版), Proceedings of SPIE - The International Society for Optical Engineering (巻 1325, pp. 267-282). Publ by Int Soc for Optical Engineering.

Observing diamond defects with an analytical color fluorescence electron microscope. / Nishimura, Kazuhito; Nakano, Tohru; Koike, Hirotami; Tomimori, Hiroshi; Kawarada, Hiroshi; Hiraki, Akio; Ogawa, Kazuo.

Proceedings of SPIE - The International Society for Optical Engineering. 版 / Albert Feldman; Sandor Holly. 巻 1325 Publ by Int Soc for Optical Engineering, 1990. p. 267-282.

研究成果: Conference contribution

Nishimura, K, Nakano, T, Koike, H, Tomimori, H, Kawarada, H, Hiraki, A & Ogawa, K 1990, Observing diamond defects with an analytical color fluorescence electron microscope. : A Feldman & S Holly (版), Proceedings of SPIE - The International Society for Optical Engineering. 巻. 1325, Publ by Int Soc for Optical Engineering, pp. 267-282, Diamond Optics III, San Diego, CA, USA, 90/7/9.
Nishimura K, Nakano T, Koike H, Tomimori H, Kawarada H, Hiraki A その他. Observing diamond defects with an analytical color fluorescence electron microscope. : Feldman A, Holly S, 編集者, Proceedings of SPIE - The International Society for Optical Engineering. 巻 1325. Publ by Int Soc for Optical Engineering. 1990. p. 267-282
Nishimura, Kazuhito ; Nakano, Tohru ; Koike, Hirotami ; Tomimori, Hiroshi ; Kawarada, Hiroshi ; Hiraki, Akio ; Ogawa, Kazuo. / Observing diamond defects with an analytical color fluorescence electron microscope. Proceedings of SPIE - The International Society for Optical Engineering. 編集者 / Albert Feldman ; Sandor Holly. 巻 1325 Publ by Int Soc for Optical Engineering, 1990. pp. 267-282
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